English  |  正體中文  |  简体中文  |  Post-Print筆數 : 27 |  Items with full text/Total items : 94586/125118 (76%)
Visitors : 30490171      Online Users : 350
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    政大機構典藏 > 商學院 > 企業管理學系 > 期刊論文 >  Item 140.119/100727
    Please use this identifier to cite or link to this item: http://nccur.lib.nccu.edu.tw/handle/140.119/100727

    Title: A Pictorial Approach to Poor Quality Cost Management
    Authors: 唐揆
    Chen, Y.S.;Tang, Kwei
    Contributors: 企管系
    Date: 1992-05
    Issue Date: 2016-08-24 17:42:38 (UTC+8)
    Abstract: A pictorial approach to modeling poor-quality cost (PQC) is proposed. The approach is patterned after that used in a computer-based information system design. It includes two major steps: (1) specifying the PQC variables as well as the significant relationship among the variables, and mapping the variables and relationships into an influence diagram showing the structure of a PQC system: and (2) converting the structure into a well-defined entity-relationship diagram showing the input-output functions and their associated properties. Two major benefits of using the pictorial approach are that the influence diagram can provide an easy-to-understand PQC system for quality management practitioners and the entity-relationship diagram can provide an effective framework for maintaining and revising the PQC system.
    Relation: IEEE Transactions on Engineering Management, 39(2), 149-157
    Data Type: article
    DOI 連結: http://dx.doi.org/10.1109/17.141272
    DOI: 10.1109/17.141272
    Appears in Collections:[企業管理學系] 期刊論文

    Files in This Item:

    File Description SizeFormat

    All items in 政大典藏 are protected by copyright, with all rights reserved.

    社群 sharing

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback