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    政大機構典藏 > 商學院 > 統計學系 > 期刊論文 >  Item 140.119/18185
    Please use this identifier to cite or link to this item: http://nccur.lib.nccu.edu.tw/handle/140.119/18185


    Title: Statistical process control for short run manufacturing systems
    Authors: 楊素芬
    Yang, Su-Fen
    Date: 2000
    Issue Date: 2008-12-19 14:53:47 (UTC+8)
    Abstract: A Shewhart X control chart is developed to monitor the process mean for large production runs. It has not been considered appropriate to monitor the process mean using the Shewhart X control chart for small production runs. In this paper we propose the design of X control chart to monitor the process mean for small production runs. For various combinations of the number of samples and the size of each sample, control coefficients of X control chart are computed by numerical methods. Using these results, the X control chart for small production runs is developed to monitor the process mean correctly. Finally, the design procedure of the X control chart for small production runs and the results of misusing the Shewhart X control chart are illustrated by an example. [ABSTRACT FROM AUTHOR]
    Relation: Process Control and Quality, 11(5), 433-439
    Data Type: article
    DOI 連結: http://dx.doi.org/10.1163/156856600750250815
    DOI: 10.1163/156856600750250815
    Appears in Collections:[統計學系] 期刊論文

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