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政大機構典藏 > 商學院 > 統計學系 > 期刊論文 > Item 140.119/18185

Please use this identifier to cite or link to this item: https://nccur.lib.nccu.edu.tw/handle/140.119/18185

Title:	Statistical process control for short run manufacturing systems
Authors:	楊素芬 Yang, Su-Fen
Date:	2000
Issue Date:	2008-12-19 14:53:47 (UTC+8)
Abstract:	A Shewhart X control chart is developed to monitor the process mean for large production runs. It has not been considered appropriate to monitor the process mean using the Shewhart X control chart for small production runs. In this paper we propose the design of X control chart to monitor the process mean for small production runs. For various combinations of the number of samples and the size of each sample, control coefficients of X control chart are computed by numerical methods. Using these results, the X control chart for small production runs is developed to monitor the process mean correctly. Finally, the design procedure of the X control chart for small production runs and the results of misusing the Shewhart X control chart are illustrated by an example. [ABSTRACT FROM AUTHOR]
Relation:	Process Control and Quality, 11(5), 433-439
Data Type:	article
DOI 連結:	http://dx.doi.org/10.1163/156856600750250815
DOI:	10.1163/156856600750250815
Appears in Collections:	[統計學系] 期刊論文

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