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    題名: Statistical process control for short run manufacturing systems
    作者: 楊素芬
    Yang, Su-Fen
    日期: 2000
    上傳時間: 2008-12-19 14:53:47 (UTC+8)
    摘要: A Shewhart X control chart is developed to monitor the process mean for large production runs. It has not been considered appropriate to monitor the process mean using the Shewhart X control chart for small production runs. In this paper we propose the design of X control chart to monitor the process mean for small production runs. For various combinations of the number of samples and the size of each sample, control coefficients of X control chart are computed by numerical methods. Using these results, the X control chart for small production runs is developed to monitor the process mean correctly. Finally, the design procedure of the X control chart for small production runs and the results of misusing the Shewhart X control chart are illustrated by an example. [ABSTRACT FROM AUTHOR]
    關聯: Process Control and Quality, 11(5), 433-439
    資料類型: article
    DOI 連結: http://dx.doi.org/10.1163/156856600750250815
    DOI: 10.1163/156856600750250815
    顯示於類別:[統計學系] 期刊論文

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