English  |  正體中文  |  简体中文  |  Post-Print筆數 : 27 |  Items with full text/Total items : 93779/124226 (75%)
Visitors : 28836802      Online Users : 104
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://nccur.lib.nccu.edu.tw/handle/140.119/56129

    Title: 國中免試升學高中職之性向測驗編製研究2/2
    Other Titles: The construction of aptitude test for secondary education under the exam policy.2/2
    Authors: 余民寧;謝名娟
    Contributors: 國立政治大學教育學系
    Keywords: 國中生;免試升學;性向測驗
    junior high school students;free entry exam;differential aptitude test
    Date: 2011
    Issue Date: 2012-11-29 11:22:07 (UTC+8)
    Abstract: 面對少子化的趨勢與馬總統英九先生的教育宣言,推動國中免試升學業已成為教育主管機關的方案之一。本研究旨在編製供國中生免試升學高中職使用的「性向測驗」,期透過本測驗,幫助學生找出最佳的選校性向之依據,使學生的潛在能力,皆能在適性的學習過程中,發揮最大的助益。本研究採用網路問卷調查法,擬透過開放式問卷結果及評閱相關文獻,加以編製完成此「性向測驗」初稿,復經獨立樣本的驗證與常模的建立,以確認本工具具備優良的信、效度特質。本研究預期可完成免試升學用之「性向測驗」工具,以及「性向測驗使用說明手冊」與「建立常模對照表」各一份。
    On the problem of population decreasing and the President Ma’s speech on education policy, the free entry exam for the K-12 is on the target for going. The purpose of this research is to construct a aptitude test for the help on the selection for entering the senior high schools or vocational schools. This research uses the web-based questionnaire for the study. It is continued for two-year term for confirming the psychometric properties of this invented aptitude test. The users’ guide and the norm-reference table are also constructed for future practical usage of this tool.
    Relation: 應用研究
    研究期間:10001~ 10012
    Data Type: report
    Appears in Collections:[教育學系] 國科會研究計畫

    Files in This Item:

    File SizeFormat

    All items in 政大典藏 are protected by copyright, with all rights reserved.

    社群 sharing

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback