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    政大機構典藏 > 商學院 > 統計學系 > 期刊論文 >  Item 140.119/61619
    Please use this identifier to cite or link to this item: http://nccur.lib.nccu.edu.tw/handle/140.119/61619


    Title: Monitoring and Diagnosing Dependent Process Steps Using VSI Control Charts
    Authors: 楊素芬
    Yang,Su-Fen;Chen,Wan-Yun
    Contributors: 統計系
    Keywords: Control charts;Dependent process steps;Optimization technique;Markov chain
    Date: 2011.03
    Issue Date: 2013-11-11 17:49:13 (UTC+8)
    Abstract: The paper proposes the variables sampling interval (VSI) scheme to monitor the means and the variances in two dependent process steps. The performance of the considered VSI control charts is measured by the adjusted average time to signal derived by a Markov chain approach. An example of the process control for the metallic film thickness of the computer connectors system shows the application and performance of the proposed VSI control charts in detecting shifts. Furthermore, the performance of the VSI control charts and the fixed sampling interval control charts are compared via the numerical analysis results. These demonstrate that the former is much faster in detecting shifts. Whenever quality engineers cannot specify the values of variable sampling intervals, the optimal VSI control charts are recommended. Furthermore, the impacts of misusing Shewhart charts to monitoring the process mean and variance in the second process step are also investigated.
    Relation: Journal of Statistical Planning and Inference, 141(5), 1808-1816
    Data Type: article
    DOI 連結: http://dx.doi.org/10.1016/j.jspi.2010.11.030
    DOI: 10.1016/j.jspi.2010.11.030
    Appears in Collections:[統計學系] 期刊論文

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