English  |  正體中文  |  简体中文  |  Items with full text/Total items : 87250/116256 (75%)
Visitors : 23291144      Online Users : 117
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    政大機構典藏 > 商學院 > 統計學系 > 期刊論文 >  Item 140.119/62441
    Please use this identifier to cite or link to this item: http://nccur.lib.nccu.edu.tw/handle/140.119/62441


    Title: Controlling over-adjusted process means and variances using VSI casue selecting control charts
    Authors: 楊素芬;Chen, Wan-Yun
    Yang, Su-Fen;Chen, Wan-Yun
    Contributors: 政大統計系
    Keywords: Control charts;Dependent process steps;Optimization technique;Markov chain
    Date: 2009-04
    Issue Date: 2013-12-12 18:07:43 (UTC+8)
    Abstract: Process adjusted unnecessarily is a common problem in statistical process control. Incorrect adjustment of a process may result in shifts in process mean, process variance, or both, ultimately affecting the quality of products. The article considers the variable process control scheme for two dependent process steps with incorrect adjustment. We construct the variable sampling interval (VSI) View the MathML source and View the MathML source control charts in order to effectively monitor the quality variable produced by the first process step with incorrect adjustment and the quality variable produced by the second process step with incorrect adjustment, respectively. The performance of the proposed VSI control charts is measured by the adjusted average time to signal (AATS) derived using a Markov chain approach. An example of process control for automobile braking system shows the application and performance of the proposed joint VSI View the MathML source and View the MathML source control charts in detecting small and median shifts in mean and variance for the two dependent process steps with incorrect adjustment. The performance of the VSI View the MathML source and View the MathML source control charts and the fixed sampling interval (FSI) View the MathML source and View the MathML source control charts are compared via the numerical analysis results. These demonstrate that the former is much faster in detecting shifts in mean and variance. Whenever quality engineers cannot specify the values of variable sampling intervals, the optimal VSI View the MathML source and View the MathML source control charts are suggested. Furthermore, the impacts of misusing View the MathML source charts to monitoring the process mean and variance in the second step are also investigated.
    Relation: Expert Systems with Applications, 36(3), 7170-7182
    Data Type: article
    DOI 連結: http://dx.doi.org/10.1016/j.eswa.2008.08.064
    DOI: 10.1016/j.eswa.2008.08.064
    Appears in Collections:[統計學系] 期刊論文

    Files in This Item:

    File SizeFormat
    71707182.pdf420KbAdobe PDF779View/Open


    All items in 政大典藏 are protected by copyright, with all rights reserved.


    社群 sharing

    著作權政策宣告
    1.本網站之數位內容為國立政治大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,惟仍請適度,合理使用本網站之內容,以尊重著作權人之權益。商業上之利用,則請先取得著作權人之授權。
    2.本網站之製作,已盡力防止侵害著作權人之權益,如仍發現本網站之數位內容有侵害著作權人權益情事者,請權利人通知本網站維護人員(nccur@nccu.edu.tw),維護人員將立即採取移除該數位著作等補救措施。
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback