English  |  正體中文  |  简体中文  |  Post-Print筆數 : 27 |  Items with full text/Total items : 91280/121421 (75%)
Visitors : 25417688      Online Users : 142
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://nccur.lib.nccu.edu.tw/handle/140.119/64095

    Title: R&D Intensity, Firm Performance and the Identification of the Threshold: Fresh Evidence from the Panel Threshold Regression
    Authors: 葉明亮;朱曉萍;佘日新;邱奕嘉
    Yeh, Ming-Liang;Chu, Hsiao-Ping;Peter J. Sher;Chiu, Yi-Chia
    Contributors: 智財所
    Date: 2010
    Issue Date: 2014-02-21 17:19:04 (UTC+8)
    Abstract: This article tests whether there is an optimal level of research and development (R&D) intensity at which point a firm is able to maximize its performance. An advanced panel threshold regression model is employed to investigate the panel threshold effect of R&D intensity on firm performance among publicly traded Taiwan information technology and electronic firms. The results confirm that a single-threshold effect does exist and show an inverted-U correlation between R&D intensity and firm performance. This article demonstrates that it is possible to identify the definitive level beyond which a further increase in R&D expenditure does not yield proportional rewards. Some important policy implications emerge from the findings.
    Relation: Applied Economics, 42(3), 389-401
    Data Type: article
    DOI 連結: http://dx.doi.org/10.1080/00036840701604487
    DOI: 10.1080/00036840701604487
    Appears in Collections:[科技管理與智慧財產研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    389401.pdf167KbAdobe PDF1017View/Open

    All items in 政大典藏 are protected by copyright, with all rights reserved.

    社群 sharing

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback