English  |  正體中文  |  简体中文  |  Post-Print筆數 : 27 |  Items with full text/Total items : 94188/124659 (76%)
Visitors : 29677137      Online Users : 487
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://nccur.lib.nccu.edu.tw/handle/140.119/70511

    Title: Investigation of Cu0.5Ni0.5/Nb interface transparency by using current-perpendicular-to-plane measurement
    Authors: 李尚凡
    Huang,S. Y.;Liang,J. J.;Hsu,S. Y.;Lin,L. K.;Tsai,T. C.;Lee,S. F.
    Contributors: 應物所
    Date: 2011-01
    Issue Date: 2014-10-09 15:51:56 (UTC+8)
    Abstract: A direct determination of the interfacial transparency on the basis of current-perpendicular-to-plane (CPP) resistances for Cu0.5Ni0.5/Nb layered system is presented. This particular realization has substantial significance for understanding the interfacial transport in such heterostructures. The unexpected large critical thickness for this weak ferromagnetic containing system can be attributed to the strong pair-breaking effect as a result of the high interfacial transparency. Besides, the strong pair-breaking also plays a decisive role in the occurrence of the dimensionality crossover of the temperature dependent upper critical magnetic field.
    Relation: European Physical Journal B,79(2),153-162
    Data Type: article
    DOI 連結: http://dx.doi.org/10.1140/epjb/e2010-10051-y
    DOI: 10.1140/epjb/e2010-10051-y
    Appears in Collections:[應用物理研究所 ] 期刊論文

    Files in This Item:

    File Description SizeFormat
    153-162.pdf624KbAdobe PDF850View/Open

    All items in 政大典藏 are protected by copyright, with all rights reserved.

    社群 sharing

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback