| Reference: | 參考資料
[1]張東生博士論文"挑選最可靠設計之研究，The Study on Selecting the Most Reliable Design" (1989)
[2] Kielpinski. T. J. and Nelson W(1975) "Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions " ,1EEE Transaction Reliability, Vol R-24,No.5.pp310-320
[3]Kielpinski, T.J.and Nelson W.(1976),”Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions", Technometrics, Vol.18. No.l, pp 171-177.
[4] Mann N.R., Schafer,R.E., and Singpurwalla, N.D.(1974), Methods for Statistical Analtsis of Reliability and Life Data. John Wiley and Sons. New York.
[5]Meeker, W.Q. and Nelson W.,(1975)"Optimum Accelerated Life Tests for the Weibull and Extreme Value Distributions". IEEE Transactions on Reliability. Vol. R-24. No.5. pp 321-332.
[6] Meeker, W. Jr and Hahn G.J.,(1977), “Asymptotically Optimum Over-Stress Tests to Estimate the Survival Probability at a Condition with a Low Expected Failure Probability". Technoruetrics, Vol.19. No.4. pp 381-404
[7] Neeker, W. Q. and Nelson W.,(1978), "Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value ,Distributions." Technometrics, Vol.20, No.2, pp 171-177.
[8] Meeker. W.Q. Jr. (1984). "A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring". Technometrics. Vol.25. 110.2. pp 105-114.
[9] Nelson, W. (1980). "Accelerated Life Testing Step-Stress Models and Data Analysis". IEEE Transactions on Reliability. Vol.R-29 No.2 PP 103-108.
[10] Nelson, W., (1982) Applied Life Data Analysis. General Electric Co., New York .
[11] Nelson.W.,"Analysis of Accelerated Life Test Data". IEEE. Transaction on Electrical Insulation. "Part I. The Arrhenius model and Graphical Methods",Vol.E1-6,No.4,1971,pp165-181,"partⅡ.Numerical Methods and Test Planing",EI-7,No.1.1972.pp36-55, "PartⅢ.Product Comparisons and Checks on the Validity of the Hodel and Data",EI-7,No.2,1972,pp 99-119.
[12] Sweeny, H.C. and Gaylor ,D.W.(1965),"Design for Optimal Prediction in Simple Linear Regression", Journal of American Statistical Association,pp205-216
[13] Tobias, P.A., Trindade. D.C,(1986),Applied Reliability Van Nostrand Reinhold Company, New York. |
