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    政大機構典藏 > 商學院 > 統計學系 > 學位論文 >  Item 140.119/83244
    Please use this identifier to cite or link to this item: https://nccur.lib.nccu.edu.tw/handle/140.119/83244


    Title: 量測誤差對X-S2管制圖設計參數之影響
    Authors: 郭又升
    Kuo, Yu-Sheng
    Contributors: 楊素芬
    Yang, Su-Fen
    郭又升
    Kuo, Yu-Sheng
    Keywords: 管制圖
    量測誤差
    更新理論
    control chart
    measurement error
    renewal theory
    Date: 2000
    Issue Date: 2016-03-31 14:44:40 (UTC+8)
    Abstract: 隨著經濟不斷的發展,企業間的競爭也愈趨激烈,因此在以利潤最大、付出成本最小的前提下,一些可能造成成本增加的因素就不能不重視。在量測產品的特性所使用的量測機器,可能因為量測設備的不精確造成誤差,進而影響測量產品品質特性的實際值。是以量測儀器測量產品特性時的誤差對於管制圖的設計參數的影響及使用管制圖監控製程的能力是我們所關切的課題。
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    15. Koo, T. and Lim, L. (1992), "Economic Design of X-bar Chart When Taguchi`s Loss Function is Considered.", Proceedings of Asian Quality Control Symposium, South Korea, pp.166-178.
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    18. Rahim, M., Lashkari, R., and Banerjee, P. (1988), "Joint Economic Design of Mean and Variance Control Charts.", Engineering Optimization, 14 pp.65-78.
    19. Rahim, M. (1989), "Determination of Optimal Design Parameters of Joint and R Charts.", Journal of Quality Technology, 21 pp.65-70.
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    Description: 碩士
    國立政治大學
    統計學系
    87354001
    Source URI: http://thesis.lib.nccu.edu.tw/record/#A2002001937
    Data Type: thesis
    Appears in Collections:[統計學系] 學位論文

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