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    题名: A systematic approach for integrated trend analysis-The case of etching
    作者: 李沛錞
    Lee, Pei-Chun
    Wu, Feng-Shang
    Shiu, Chun-Chi
    Su*, Hsin-Ning
    贡献者: 圖檔所
    关键词: Bibliometric analysis;Patent analysis;Text-mining;Trend analysis;Etching
    日期: 2011-03
    上传时间: 2019-09-19 09:46:45 (UTC+8)
    摘要: Understanding technology development trends is of critical importance to countries, industries and enterprises to be sustainable in global competition. Attempts have been made to establish trend analysis by bibliometric and patent analyses. Also text-mining uncovers hidden and important information from structured or unstructured documents which serve as knowledge carriers. This study aims to provide a systematic approach for integrated trend analysis that takes into account bibliometric analysis, patent analysis and text-mining analysis. Etching is selected as the case study for integrating trend analysis method proposed in this study. Also, validity and applicability of the integrated analysis are evaluated.
    關聯: Technological Forecasting and Social Change, Vol.78, No.3, pp.386-407
    数据类型: article
    DOI 連結: https://doi.org/10.1016/j.techfore.2010.08.006
    DOI: 10.1016/j.techfore.2010.08.006
    显示于类别:[圖書資訊與檔案學研究所] 期刊論文

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